Automatic Solar cell EL+IV Integrated Tester

The Automatic Solar cell EL+IV Integrated Tester is a highly integrated, advanced inspection equipment specifically designed for the photovoltaic industry. It efficiently and precisely performs online quality inspection and performance evaluation of solar wafers. Innovatively combining EL (Electroluminescence) defect detection and IV (Current-Voltage characteristic) performance testing functions into a single automated platform, it utilizes robotic arms or conveyor belts for automatic loading/unloading. The wafers are sequentially guided through the EL imaging system in a darkroom environment and the IV testing station. This process simultaneously captures internal defect images (such as micro-cracks, broken fingers, and fragments) and key electrical performance parameters (efficiency, open-circuit voltage, short-circuit current, fill factor, etc.). This equipment significantly enhances inspection efficiency and consistency, serving as a core tool for quality control, process optimization, and binning/sorting during wafer production, ensuring products meet high standards.

Product Features

Dual-Function Integration: EL detects defects (micro-cracks, sintering issues), IV measures performance (efficiency, power).
Full Automation: Automatic loading/unloading, positioning, testing; seamless integration with production lines.
High Efficiency & Precision: High-speed testing (typically up to thousands of wafers/hour), high-resolution EL imaging.
Intelligent Analysis: Software automatically identifies defects, performs binning, and generates reports.
Process Closed Loop: Real-time data feedback guides production adjustments, improving yield.

Technical Specifications

Model: YHZD-ELIV
Wafer Specification: Compatible with Mono-crystalline, Multi-crystalline, PERC, HJT, TOPCon, etc.
Camera Resolution: 5 Megapixels
Camera Type: Custom High-Definition Industrial Camera
Testing Orientation: Vertically Downward
Light Source: Complies with IEC 60904-9:2020 Standard
Irradiance Instability: ≤2%
Irradiance Non-Uniformity: ≤2%
Single Flash Pulse Duration: 10ms
Throughput: 2000~5000 Wafers/Hour
Breakage Rate: ≤0.05% (Grade A Wafers)
Sensitivity: Capable of detecting cracks narrower than 0.03mm
Loading Method: Automatic Loading/Unloading
Effective Testing Area: 230*230mm
Binning Cassettes: 8 Binning Cassettes (Optional)
Function Expansion: Can be equipped with AOI/PL inspection functions

Applications

PV cell Manufacturing Plants: Serves as a key quality control point on the production line. Automatically detects internal wafer defects (micro-cracks, cracks, broken fingers, poor soldering, fragments, chipped edges, black spots, impurities) and sorts out non-conforming products to prevent them from flowing into downstream processes. Also performs power testing and binning.
PV Module Manufacturing Plants: Incoming material inspection. Performs EL testing on wafers before they enter the string soldering process to ensure received wafers meet quality requirements, preventing wafers with defects like micro-cracks from being made into modules causing potential failures (e.g., hot-spot effects). IV testing ensures wafers within the produced modules are of uniform specifications.
Laboratories: Used for research and analysis of PV wafers to study new types of PV components.